Reliability is as much a key to success in the microelectronicsindustry as is performance. Not only must a product perform asdesired, it must also work for an extended period of time withoutfail, ...

Electromigration (EM) remains a critical reliability challenge in modern microelectronic systems, particularly as device miniaturisation and increased current densities intensify the phenomenon. In ...

The replacement of aluminum with copper interconnect wiring, first demonstrated by IBM in 1997, brought the integrated circuit industry substantial improvements in both resistance to electromigration ...

An innovative measurement technique is providing new insights on electromigration, a leading cause of premature death of microcircuits. Until recently, this phenomenon, which causes fatal shorts and ...

In the consumer electronics world, knowing the difference between root mean square (RMS) and peak power ratings can make or break the performance and clarity of an audio system. In short, RMS power is ...

While integrated circuit manufacturers have worried about electromigration for a long time, until recently most of their concerns have focused on the on-chip interconnects. The larger dimensions found ...