The foundation of parametric test within semiconductor manufacturing is its usefulness in determining that wafers have been fabricated properly. Foundries use parametric test results to help verify ...

Assume that we have a sequence of n independent and identically distributed random variables with a continuous distribution function F, which is specified up to a few unknown parameters. In this paper ...

Insurance is one of the few industries that have remained largely unchanged over the past few decades at a low level: You suffer losses as a direct result of something going south, and you get paid by ...

Santa Rosa, CA. Keysight Technologies today announced the third generation of its P9000 Series massively parallel parametric test system. The system accelerates the fast ramp of new technology and ...

March 30, 2012. Keithley Instruments Inc. has enhanced the capabilities of its S530 parametric test systems for high-speed production parametric test. Supported by the latest version of Keithley Test ...

Advanced packaging is transforming semiconductor manufacturing into a multi-dimensional challenge, blending 2D front-end wafer fabrication with 2.5D/3D assemblies, high-frequency device ...